# Defect clustering-aware spare-TSV allocation for 3D ICs

> Research article (2015 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 2015) · cited 10× · AI/ML

**Wikidata**: [openalex:W4248025886](https://www.wikidata.org/wiki/openalex:W4248025886)  
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