# Defect-based compact modeling for RTN and BTI variability

> Research article (2017 IEEE International Reliability Physics Symposium (IRPS), 2017) · cited 22× · AI/ML

**Wikidata**: [openalex:W2620902341](https://www.wikidata.org/wiki/openalex:W2620902341)  
**Source**: https://4ort.xyz/entity/defect-based-compact-modeling-for-rtn-and-bti-variability