# Deep Residual Neural Network-Based Defect Detection on Complex Backgrounds

> Research article (IEEE Transactions on Instrumentation and Measurement, 2022) · cited 20× · AI/ML

**Wikidata**: [openalex:W4210395945](https://www.wikidata.org/wiki/openalex:W4210395945)  
**Source**: https://4ort.xyz/entity/deep-residual-neural-network-based-defect-detection-on-complex-backgrounds