# Deep Learning for improving the storage process: Accurate and automatic segmentation of spoiled areas on apples

> Research article (2021 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), 2021) · cited 14× · AI/ML

**Wikidata**: [openalex:W3176041514](https://www.wikidata.org/wiki/openalex:W3176041514)  
**Source**: https://4ort.xyz/entity/deep-learning-for-improving-the-storage-process-accurate-and-automatic-segmentation-of-spoiled-areas-on-apples