# Deep Learning-Based Integrated Circuit Surface Defect Detection: Addressing Information Density Imbalance for Industrial Application

> Research article (International Journal of Computational Intelligence Systems, 2024) · cited 21× · AI/ML

**Wikidata**: [openalex:W4391815505](https://www.wikidata.org/wiki/openalex:W4391815505)  
**Source**: https://4ort.xyz/entity/deep-learning-based-integrated-circuit-surface-defect-detection-addressing-information-density-imbalance-for-industrial-