# Deep Learning-Based Generic Automatic Surface Defect Inspection (ASDI) With Pixelwise Segmentation

> Research article (IEEE Transactions on Instrumentation and Measurement, 2020) · cited 46× · AI/ML

**Wikidata**: [openalex:W3094374092](https://www.wikidata.org/wiki/openalex:W3094374092)  
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