# Deep Learning-Based Detection of Defects in Wafer Buffer Zone During Semiconductor Packaging Process

> Research article (Multiscale Science and Engineering, 2024) · cited 19× · AI/ML

**Wikidata**: [openalex:W4391823537](https://www.wikidata.org/wiki/openalex:W4391823537)  
**Source**: https://4ort.xyz/entity/deep-learning-based-detection-of-defects-in-wafer-buffer-zone-during-semiconductor-packaging-process