# Deep Learning Analysis of 3D X-ray Images for Automated Object Detection and Attribute Measurement of Buried Package Features

> Research article (2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC), 2020) · cited 23× · AI/ML

**Wikidata**: [openalex:W3127087905](https://www.wikidata.org/wiki/openalex:W3127087905)  
**Source**: https://4ort.xyz/entity/deep-learning-analysis-of-3d-x-ray-images-for-automated-object-detection-and-attribute-measurement-of-buried-package-fea