# Deep Convolutional Generative Adversarial Networks-Based Data Augmentation Method for Classifying Class-Imbalanced Defect Patterns in Wafer Bin Map

> Research article (Applied Sciences, 2023) · cited 10× · AI/ML

**Wikidata**: [openalex:W4367319337](https://www.wikidata.org/wiki/openalex:W4367319337)  
**Source**: https://4ort.xyz/entity/deep-convolutional-generative-adversarial-networks-based-data-augmentation-method-for-classifying-class-imbalanced-defec