# Dedicated random telegraph noise characterization of Ni/HfO2-based RRAM devices

> Research article (Microelectronic Engineering, 2015) · cited 10× · AI/ML

**Wikidata**: [openalex:W2065265280](https://www.wikidata.org/wiki/openalex:W2065265280)  
**Source**: https://4ort.xyz/entity/dedicated-random-telegraph-noise-characterization-of-ni-hfo2-based-rram-devices