# Decoupling Sub-micron Resolution and Speed from Sample Size in 3D X-ray Imaging

> Research article (2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2022) · cited 11× · AI/ML

**Wikidata**: [openalex:W4312363515](https://www.wikidata.org/wiki/openalex:W4312363515)  
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