# Decision Tree Ensemble-Based Wafer Map Failure Pattern Recognition Based on Radon Transform-Based Features

> Research article (IEEE Transactions on Semiconductor Manufacturing, 2018) · cited 187× · AI/ML

**Wikidata**: [openalex:W2792944472](https://www.wikidata.org/wiki/openalex:W2792944472)  
**Source**: https://4ort.xyz/entity/decision-tree-ensemble-based-wafer-map-failure-pattern-recognition-based-on-radon-transform-based-features