# Deceleration of probe beam by stage bias potential improves resolution of serial block-face scanning electron microscopic images

> Research article (Advanced Structural and Chemical Imaging, 2016) · cited 26× · AI/ML

**Wikidata**: [openalex:W2519159638](https://www.wikidata.org/wiki/openalex:W2519159638)  
**Source**: https://4ort.xyz/entity/deceleration-of-probe-beam-by-stage-bias-potential-improves-resolution-of-serial-block-face-scanning-electron-microscopi