# Data-driven optimization of accessory combinations for final testing processes in semiconductor manufacturing

> Research article (Journal of Manufacturing Systems, 2022) · cited 20× · AI/ML

**Wikidata**: [openalex:W4226463366](https://www.wikidata.org/wiki/openalex:W4226463366)  
**Source**: https://4ort.xyz/entity/data-driven-optimization-of-accessory-combinations-for-final-testing-processes-in-semiconductor-manufacturing