# Cycling pattern and read/bake conditions dependence of random telegraph noise in decananometer NAND flash arrays

> Research article (2015 IEEE International Reliability Physics Symposium, 2015) · cited 20× · AI/ML

**Wikidata**: [openalex:W1607955097](https://www.wikidata.org/wiki/openalex:W1607955097)  
**Source**: https://4ort.xyz/entity/cycling-pattern-and-read-bake-conditions-dependence-of-random-telegraph-noise-in-decananometer-nand-flash-arrays