# Cryogenic Characterization of Low-Frequency Noise in 40-nm CMOS

> Research article (IEEE Journal of the Electron Devices Society, 2024) · cited 13× · AI/ML

**Wikidata**: [openalex:W4400878576](https://www.wikidata.org/wiki/openalex:W4400878576)  
**Source**: https://4ort.xyz/entity/cryogenic-characterization-of-low-frequency-noise-in-40-nm-cmos