# Cross-Project Defect Prediction Using a Credibility Theory Based Naive Bayes Classifier

> Research article (2017 IEEE International Conference on Software Quality, Reliability and Security (QRS), 2017) · cited 23× · AI/ML

**Wikidata**: [openalex:W2743521762](https://www.wikidata.org/wiki/openalex:W2743521762)  
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