# Convolutional Neural Network for Imbalanced Data Classification of Silicon Wafer Defects

> Research article (2020 16th IEEE International Colloquium on Signal Processing & Its Applications (CSPA), 2020) · cited 24× · AI/ML

**Wikidata**: [openalex:W3017220377](https://www.wikidata.org/wiki/openalex:W3017220377)  
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