# Composite Wafer Defect Recognition Framework Based on Multiview Dynamic Feature Enhancement With Class-Specific Classifier

> Research article (IEEE Transactions on Instrumentation and Measurement, 2023) · cited 21× · AI/ML

**Wikidata**: [openalex:W4360993939](https://www.wikidata.org/wiki/openalex:W4360993939)  
**Source**: https://4ort.xyz/entity/composite-wafer-defect-recognition-framework-based-on-multiview-dynamic-feature-enhancement-with-class-specific-classifi