# Comparison and statistical analysis of four write stability metrics in bulk CMOS static random access memory cells

> Research article (Japanese Journal of Applied Physics, 2015) · cited 23× · AI/ML

**Wikidata**: [openalex:W2025222055](https://www.wikidata.org/wiki/openalex:W2025222055)  
**Source**: https://4ort.xyz/entity/comparison-and-statistical-analysis-of-four-write-stability-metrics-in-bulk-cmos-static-random-access-memory-cells