# Compact Reliability Model of Analog RRAM for Computation-in-Memory Device-to-System Codesign and Benchmark

> Research article (IEEE Transactions on Electron Devices, 2021) · cited 15× · AI/ML

**Wikidata**: [openalex:W3156378803](https://www.wikidata.org/wiki/openalex:W3156378803)  
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