# Compact Modeling of Drain Current Thermal Noise in FDSOI MOSFETs Including Back-Bias Effect

> Research article (IEEE Transactions on Microwave Theory and Techniques, 2017) · cited 19× · AI/ML

**Wikidata**: [openalex:W2592319301](https://www.wikidata.org/wiki/openalex:W2592319301)  
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