# Compact Analytical Model to Extract Write Static Noise Margin (WSNM) for SRAM Cell at 45-nm and 65-nm Nodes

> Research article (IEEE Transactions on Semiconductor Manufacturing, 2017) · cited 53× · AI/ML

**Wikidata**: [openalex:W2768020833](https://www.wikidata.org/wiki/openalex:W2768020833)  
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