# CNN-based Stochastic Regression for IDDQ Outlier Identification

> Research article (2020 IEEE 38th VLSI Test Symposium (VTS), 2020) · cited 11× · AI/ML

**Wikidata**: [openalex:W3032952423](https://www.wikidata.org/wiki/openalex:W3032952423)  
**Source**: https://4ort.xyz/entity/cnn-based-stochastic-regression-for-iddq-outlier-identification