# CNN and ensemble learning based wafer map failure pattern recognition based on local property based features

> Research article (Journal of Intelligent Manufacturing, 2022) · cited 13× · AI/ML

**Wikidata**: [openalex:W4297502709](https://www.wikidata.org/wiki/openalex:W4297502709)  
**Source**: https://4ort.xyz/entity/cnn-and-ensemble-learning-based-wafer-map-failure-pattern-recognition-based-on-local-property-based-features