# Clustering the Dominant Defective Patterns in Semiconductor Wafer Maps

> Research article (IEEE Transactions on Semiconductor Manufacturing, 2017) · cited 31× · AI/ML

**Wikidata**: [openalex:W2767053056](https://www.wikidata.org/wiki/openalex:W2767053056)  
**Source**: https://4ort.xyz/entity/clustering-the-dominant-defective-patterns-in-semiconductor-wafer-maps