# Classification of Three-Level Random Telegraph Noise and Its Application in Accurate Extraction of Trap Profiles in Oxide-Based Resistive Switching Memory

> Research article (IEEE Electron Device Letters, 2018) · cited 10× · AI/ML

**Wikidata**: [openalex:W2883295043](https://www.wikidata.org/wiki/openalex:W2883295043)  
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