# Classification of Silicon (Si) Wafer Material Defects in Semiconductor Choosers using a Deep Learning ShuffleNet-v2-CNN Model

> Research article (Advances in Materials Science and Engineering, 2022) · cited 18× · AI/ML

**Wikidata**: [openalex:W4296131864](https://www.wikidata.org/wiki/openalex:W4296131864)  
**Source**: https://4ort.xyz/entity/classification-of-silicon-si-wafer-material-defects-in-semiconductor-choosers-using-a-deep-learning-shufflenet-v2-cnn-mo