# Classification and evaluation for nearside/backside defect via magnetic flux leakage: A dual probe design with SVM and PSO intelligence algorithms

> Research article (NDT & E International, 2024) · cited 11× · AI/ML

**Wikidata**: [openalex:W4393131805](https://www.wikidata.org/wiki/openalex:W4393131805)  
**Source**: https://4ort.xyz/entity/classification-and-evaluation-for-nearside-backside-defect-via-magnetic-flux-leakage-a-dual-probe-design-with-svm-and-ps