# Circuit Reliability Analysis of RRAM-based Logic-in-Memory Crossbar Architectures Including Line Parasitic Effects, Variability, and Random Telegraph Noise

> Research article (2020 IEEE International Reliability Physics Symposium (IRPS), 2020) · cited 12× · AI/ML

**Wikidata**: [openalex:W3039182055](https://www.wikidata.org/wiki/openalex:W3039182055)  
**Source**: https://4ort.xyz/entity/circuit-reliability-analysis-of-rram-based-logic-in-memory-crossbar-architectures-including-line-parasitic-effects-varia