# Charge Pumping and Flicker Noise-based Defect Characterization in Ferroelectric FETs

> Research article (2020 IEEE International Integrated Reliability Workshop (IIRW), 2020) · cited 23× · AI/ML

**Wikidata**: [openalex:W3118940158](https://www.wikidata.org/wiki/openalex:W3118940158)  
**Source**: https://4ort.xyz/entity/charge-pumping-and-flicker-noise-based-defect-characterization-in-ferroelectric-fets