# Characterization of TLC 3D-NAND Flash Endurance through Machine Learning for LDPC Code Rate Optimization

> Research article (2017 IEEE International Memory Workshop (IMW), 2017) · cited 37× · AI/ML

**Wikidata**: [openalex:W2621414262](https://www.wikidata.org/wiki/openalex:W2621414262)  
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