# Characterization of the Impairment and Recovery of GaN-HEMTs in Low-Noise Amplifiers under Input Overdrive

> Research article (2021 IEEE MTT-S International Microwave Symposium (IMS), 2021) · cited 12× · AI/ML

**Wikidata**: [openalex:W3208503749](https://www.wikidata.org/wiki/openalex:W3208503749)  
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