# Characterization of Sputtered CdTe Thin Films with Electron Backscatter Diffraction and Correlation with Device Performance

> Research article (Microscopy and Microanalysis, 2015) · cited 14× · AI/ML

**Wikidata**: [openalex:W2217222811](https://www.wikidata.org/wiki/openalex:W2217222811)  
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