# Characterization of Single Defects in Ultrascaled MoS<sub><b>2</b></sub> Field-Effect Transistors

> Research article (ACS Nano, 2018) · cited 74× · AI/ML

**Wikidata**: [openalex:W2805585035](https://www.wikidata.org/wiki/openalex:W2805585035)  
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