# Characterization of MEMS accelerometer self-noise by means of PSD and Allan Variance analysis

> Research article (2017 7th IEEE International Workshop on Advances in Sensors and Interfaces (IWASI), 2017) · cited 36× · AI/ML

**Wikidata**: [openalex:W2736234232](https://www.wikidata.org/wiki/openalex:W2736234232)  
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