# Characterization and Modeling of Temperature Effects in 3-D NAND Flash Arrays—Part II: Random Telegraph Noise

> Research article (IEEE Transactions on Electron Devices, 2018) · cited 34× · AI/ML

**Wikidata**: [openalex:W2806574537](https://www.wikidata.org/wiki/openalex:W2806574537)  
**Source**: https://4ort.xyz/entity/characterization-and-modeling-of-temperature-effects-in-3-d-nand-flash-arrayspart-ii-random-telegraph-noise