# Characterization and Modeling of Temperature Effects in 3-D NAND Flash Arrays—Part I: Polysilicon-Induced Variability

> Research article (IEEE Transactions on Electron Devices, 2018) · cited 76× · AI/ML

**Wikidata**: [openalex:W2806385061](https://www.wikidata.org/wiki/openalex:W2806385061)  
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