# Characterization and modeling of single defects in GaN/AlGaN fin-MIS-HEMTs

> Research article (2017 IEEE International Reliability Physics Symposium (IRPS), 2017) · cited 14× · AI/ML

**Wikidata**: [openalex:W2620676434](https://www.wikidata.org/wiki/openalex:W2620676434)  
**Source**: https://4ort.xyz/entity/characterization-and-modeling-of-single-defects-in-gan-algan-fin-mis-hemts