# Cascaded Approach to Defect Location and Classification in Microelectronic Bonded Joints: Improved Level Set and Random Forest

> Research article (IEEE Transactions on Industrial Informatics, 2019) · cited 16× · AI/ML

**Wikidata**: [openalex:W2985580362](https://www.wikidata.org/wiki/openalex:W2985580362)  
**Source**: https://4ort.xyz/entity/cascaded-approach-to-defect-location-and-classification-in-microelectronic-bonded-joints-improved-level-set-and-random-f