# BS-YOLOv5s: Insulator Defect Detection with Attention Mechanism and Multi-Scale Fusion

> Research article (2023 IEEE International Conference on Image Processing (ICIP), 2023) · cited 15× · AI/ML

**Wikidata**: [openalex:W4386598299](https://www.wikidata.org/wiki/openalex:W4386598299)  
**Source**: https://4ort.xyz/entity/bs-yolov5s-insulator-defect-detection-with-attention-mechanism-and-multi-scale-fusion