# BIST-Based Fault Diagnosis for PCM With Enhanced Test Scheme and Fault-Free Region Finding Algorithm

> Research article (IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2020) · cited 10× · AI/ML

**Wikidata**: [openalex:W3021762866](https://www.wikidata.org/wiki/openalex:W3021762866)  
**Source**: https://4ort.xyz/entity/bist-based-fault-diagnosis-for-pcm-with-enhanced-test-scheme-and-fault-free-region-finding-algorithm