# Bilayer Markov Random Field Method for Detecting Defects in Patterned Fabric

> Research article (Journal of Circuits Systems and Computers, 2021) · cited 13× · AI/ML

**Wikidata**: [openalex:W3203169714](https://www.wikidata.org/wiki/openalex:W3203169714)  
**Source**: https://4ort.xyz/entity/bilayer-markov-random-field-method-for-detecting-defects-in-patterned-fabric