# Bayesian Inference for Susceptibility of Electronics to Transient Electromagnetic Disturbances With Failure Mechanism Consideration

> Research article (IEEE Transactions on Electromagnetic Compatibility, 2019) · cited 20× · AI/ML

**Wikidata**: [openalex:W2956680622](https://www.wikidata.org/wiki/openalex:W2956680622)  
**Source**: https://4ort.xyz/entity/bayesian-inference-for-susceptibility-of-electronics-to-transient-electromagnetic-disturbances-with-failure-mechanism-co