# Automatic Semiconductor Wafer Image Segmentation for Defect Detection Using Multilevel Thresholding

> Research article (MATEC Web of Conferences, 2016) · cited 10× · AI/ML

**Wikidata**: [openalex:W2527824500](https://www.wikidata.org/wiki/openalex:W2527824500)  
**Source**: https://4ort.xyz/entity/automatic-semiconductor-wafer-image-segmentation-for-defect-detection-using-multilevel-thresholding