# Automatic measurement system for the DC and low-f noise characterization of FETs at wafer level

> Research article (2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, 2015) · cited 22× · AI/ML

**Wikidata**: [openalex:W1520850230](https://www.wikidata.org/wiki/openalex:W1520850230)  
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