# Automatic Industry PCB Board DIP Process Defect Detection with Deep Ensemble Method

> Research article (2020 IEEE 29th International Symposium on Industrial Electronics (ISIE), 2020) · cited 41× · AI/ML

**Wikidata**: [openalex:W3046341154](https://www.wikidata.org/wiki/openalex:W3046341154)  
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