# Automatic Identification of Yield Limiting Layout Patterns Using Root Cause Deconvolution on Volume Scan Diagnosis Data

> Research article (2017 IEEE 26th Asian Test Symposium (ATS), 2017) · cited 13× · AI/ML

**Wikidata**: [openalex:W2787570284](https://www.wikidata.org/wiki/openalex:W2787570284)  
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