# Automatic Evaluation of Wheat Resistance to Fusarium Head Blight Using Dual Mask-RCNN Deep Learning Frameworks in Computer Vision

> Research article (Remote Sensing, 2020) · cited 128× · AI/ML

**Wikidata**: [openalex:W3118053069](https://www.wikidata.org/wiki/openalex:W3118053069)  
**Source**: https://4ort.xyz/entity/automatic-evaluation-of-wheat-resistance-to-fusarium-head-blight-using-dual-mask-rcnn-deep-learning-frameworks-in-comput