# Automatic Defect Classification Using Semi-Supervised Learning With Defect Localization

> Research article (IEEE Transactions on Semiconductor Manufacturing, 2023) · cited 17× · AI/ML

**Wikidata**: [openalex:W4385643643](https://www.wikidata.org/wiki/openalex:W4385643643)  
**Source**: https://4ort.xyz/entity/automatic-defect-classification-using-semi-supervised-learning-with-defect-localization